Operate ellipsometry and AFM tools, including creating measurement recipes, optimizing data collection and analysis routines, and performing routine data analysis/modeling
Innovate and improve upon metrology protocols to achieve higher resolution measurements of key parameters, enable measurements of hard‑to‑measure features, etc, differentiating between samples with extremely small differences, while ensuring timely execution of routine
Synthesize complex physics and implement statistical methodologies to rigorously correlate in‑fab metrology with offline characterization
Link the material property outputs of metrology to critical device parameters on a variety of different technology platforms
Justify process shifts and trend variances by anchoring data‑driven insights in fundamental material science principles
Coordinate with internal software development and data analysis teams t...